Group 1: Tests that implement a continuous load of random write type with a change in the size of the block I / O operations (I / O).
When creating a test load, the following additional parameters of the fio program are used:
- rw = randwrite
- blocksize = 4K
- numjobs = 64
- iodepth = 64
A test group consists of four tests that differ in the total volume of LUNs presented with the tested storage system, the size of the block of I / O operations and the I / O direction (write or read):
- a test for recording performed on a fully-marked storage system — the total volume of the presented LUNs is equal to the usable storage capacity of the storage system, the test duration is 7.5 hours;
- write tests with varying block size (4,32,1024K), performed on a fully-marked storage system, the duration of each test is 4.5 hours. Pause between tests - 2 hours.
Based on the test results, based on the data output by the vxstat command, graphs are generated that combine the test results:
- IOPS as a function of time;
- Latency as a function of time.
The analysis of the received information is carried out and conclusions are drawn about:
- the presence of performance degradation during long-term load on the record and reading;
- the performance of the service processes storage (Garbage Collection), limiting the performance of the disk array to write during a long peak load;
- the degree of influence of the size of the block of I / O operations on the performance of the storage service processes;
- the amount of space reserved for storage for leveling storage service processes.
Group 2: Disk array performance tests with different types of load, executed at the block device level created by Symantec Volume Manager (VxVM) with a LUN block size of 512 bytes.
During testing, the following types of loads are investigated:
- load profiles (changeable software parameters fio: randomrw, rwmixedread):
- random recording 100%;
- random write 30%, random read 70%;
- random read 100%.
- block sizes: 1KB, 8KB, 16KB, 32KB, 64KB, 1MB (changeable software parameter fio: blocksize);
- methods of processing I / O operations: synchronous, asynchronous (variable software parameter fio: ioengine);
- the number of load generating processes: 1, 2, 4, 8, 16, 32, 64, 128, 160, 192 (changeable software parameter fio: numjobs);
- queue depth (for asynchronous I / O operations): 32, 64 (changeable software parameter fio: iodepth).
A test group consists of a set of tests representing all possible combinations of the above types of load. To level the impact of the Garbage Collection service processes on the test results, between the tests a pause is realized equal to the ratio of the amount of information recorded during the test to the performance of the storage service processes (determined by the results of the first group of tests).
Based on the test results, the following graphs are generated for each combination of the following load types based on the data output by the fio software after each of the tests: load profile, method of processing I / O operations, queue depth, which combine tests with different I / O block values :
- IOPS - as a function of the number of load generating processes;
- Bandwidth - as a function of the number of processes that generate the load;
- Latitude (clat) - as a function of the number of processes that generate the load;
The analysis of the obtained results is carried out, conclusions are drawn on the load characteristics of the disk array at latency <1ms.
Group 3: disk array performance tests with a synchronous I / O method, different types of load, executed at the level of a block device created using Linux LVM, with a block size of LUN of 4KiB.
Tests are conducted similarly to tests of group 2, but only the synchronous method of iv is investigated because of the limited testing time. At the end of each test, graphs are constructed showing the difference in% of the obtained performance indicators (iops, latency) from those obtained during testing with a block size of LUN 512 bytes (test group 2). Conclusions are made about the effect of the size of the LUN block on the performance of the disk array.