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Micron: A little more detailed about the production of 65nm microcircuits in Russia

Yesterday, all domestic websites were flooded with the news that in Russia, Micron developed a technology for the production of microcircuits according to 65nm standards (or even “The first 65nm microchips were produced in Russia”). Previously, Micron had a 90nm technology licensed from STMicroelectronics. Let's try to sort out in more detail how things are going there.

Micron this time surprisingly published a lot of information. The photographs show the layout of a single test transistor and photographs taken with an electron microscope. Under the cut, let's see how this could be done and compared with the Intel 65nm.

Comparison of technical processes

Micron published a table with the parameters of their technical process. For comparison, I added Intel 65nm process technology:
TechnologyMicron 65nmMicron 90nmIntel 65nm
Gate length45nm
On the photo 54nm
65nm35-38nm
+ Sige stress
Gate oxide thickness (electrical)2.2nm (n) / 2.2nm (p)2.2nm (n) / 2.2nm (p)1.2nm SiON
Interconnect9-Cu + 1-Al7-Cu + 1-Al8-Cu
Metal 1 pitch0.18µm0.24µm0.21µm
Inter-level dielectrick = 2.9k = 2.9k = 2.9
M1 pitch (step of the first level of metallization) is somewhat doubtful: as the step of the metal M1 is less than 0.2-0.3 μm (for 65nm technology), the speed of the microcircuit rapidly decreases due to the increase of the RC constant, because Intel did not reduce it to less than 0.21 -0.22µm. Another reminder that interconnects are the main brake on the progress of microelectronics.

The length of the gate and the thickness of the gate dielectric indicates that this LP process technology is of low consumption and slower operation. So, to make a processor similar to the first Core2Duo on Micron will not work out yet, but there are plenty of applications for LP technical processes.
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The number of metals allows to implement processors of any complexity.

In pursuit of 65nm

As we remember , the resolution of optical photolithography is subject to Rayleigh criterion:


At the moment, the most advanced installation of photolithography on Micron (ASML PAS / 1150C scanner) has NA = 0.75 and operates at a wavelength of 193 nm. The parameter k is a multiplier of the “tricks” used to improve the resulting resolution. k for photolithography without tricks - 0.4. In the case of Mikronovskiy 90nm - k it was already 0.35. In order to get an honest 65nm with the same scanner, k would need to be somehow reduced to 0.25 (i.e., a lot of tricks should be added).

However, taking into account the words from the press release (“special algorithms for the introduction of optical correction of photolithography were developed”), the usual, classical topology of the test transistor (not using the “one-dimensional” structure) and the length of the gate in the photo (54nm) - at the moment looks just like the current equipment without additional tricks made the transistors with a smaller gate for the first tests (this dramatically increases the rejection rate, but for the test transistors is acceptable) + have worked out new technological steps of the process, about differing from 90nm.

They say that in March 2014 Micron is waiting for the arrival of a new scanner - and it will turn out 65nm without additional tricks, and with tricks - more subtle technical processes (45nm, lower?). Then, by the end of the year (or even in 2015), the first full-fledged microcircuits using 65nm technology will be released. The volume of production is expected to be about 500 200 mm plates per month - this almost guarantees that the production will be very expensive, and available only to the state.

Finally about possible tricks

65nm can be obtained on the current equipment Micron. It is enough to recall how Intel in 2007 made the 45nm technical process on “dry” photolithography using a scanner with an aperture of 0.93 (I recall 0.75 from Micron): critical layers were exposed in 2 runs: on the first run they exposed a number of horizontal lines (using dipole illumination, polarization - so you can achieve a higher resolution, but only along one axis). Then the second exposure cut the lines into pieces of the desired shape. The result on the photo. Actually, in a similar way, the resolution is 32nm.

This approach allows us to obtain k = 0.21, and for the Mikronovsky scanner, this would allow to obtain a 55nm process technology. But certainly the amount of work would be very impressive.

Summary


Links

Press release Micron
News CNews with some additions
Intel 65nm Technology Overview
Comparative table of the whole heap of technologies

Source: https://habr.com/ru/post/213373/


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